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Glove-box system with internal spin-coating, annealing, and multi-source thermal evaporation systems for fabrication of organic devices; device characterization (current-voltage sourmeters, quantum efficiency, solar simulator, cryostat equipped capacitance and impedance spectroscopy); multi-module atomic force microscopy
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Other structural, optical, and electronic device characterization facilities in the same building at
Microelectronics Research Center
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Central materials characterization and microscopy facility at
Materials Analysis Research Laboratory. We also use the following facilities in our collaborators' labs: Raman Spectroscopy (Prof. Emily Smith's lab), Fluorescence Lifetime setup (Prof. Jake Petrich's lab), X-ray diffraction (Prof. David Vaknin's lab), Ellipsometry (Prof. Andrew Hillier's lab), Laser interference lithography (Prof. Kai-Ming Ho's lab), LED characterization (Prof. Joe Shinar's lab)
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